bookmark eC-CLEM / easy cell-correlative light to electron microscopy Solves the problem of achieving accurate association. eC-CLEM allows several types of registration, corresponding to different correlative workflows in 2D and 3D (or a mix of both dimensions). It can be used to register 3D LM (light microscopy) with 2D EM (electron microcopy), or to extract a slice with the correct transformation from an LM stack using artificial or natural fiducials. The tool offers preliminary image preprocessing for rapid data extraction. It evaluates the need to apply nonrigid registration to obtain accurate registration.